发明申请
US20110038457A1 X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIENTATION USING X-RAY FOCUSING OPTIC
有权
使用X射线聚焦光学测量谷物方位的X射线衍射装置和技术
- 专利标题: X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIENTATION USING X-RAY FOCUSING OPTIC
- 专利标题(中): 使用X射线聚焦光学测量谷物方位的X射线衍射装置和技术
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申请号: US12710827申请日: 2010-02-23
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公开(公告)号: US20110038457A1公开(公告)日: 2011-02-17
- 发明人: Huapeng HUANG , Alexei VERSHININ
- 申请人: Huapeng HUANG , Alexei VERSHININ
- 申请人地址: US NY East Greenbush
- 专利权人: X-RAY OPTICAL SYSTEMS, INC.
- 当前专利权人: X-RAY OPTICAL SYSTEMS, INC.
- 当前专利权人地址: US NY East Greenbush
- 主分类号: G01N23/207
- IPC分类号: G01N23/207
摘要:
An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.
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