发明申请
US20110042685A1 SUBSTRATES AND METHODS OF FABRICATING EPITAXIAL SILICON CARBIDE STRUCTURES WITH SEQUENTIAL EMPHASIS
审中-公开
基质和方法制备具有顺序渗透性的外源性碳化硅结构
- 专利标题: SUBSTRATES AND METHODS OF FABRICATING EPITAXIAL SILICON CARBIDE STRUCTURES WITH SEQUENTIAL EMPHASIS
- 专利标题(中): 基质和方法制备具有顺序渗透性的外源性碳化硅结构
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申请号: US12543473申请日: 2009-08-18
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公开(公告)号: US20110042685A1公开(公告)日: 2011-02-24
- 发明人: Li Wang , Sima Dimitrijev , Alan Iacopi , Jisheng Han , Leonie Hold , Philip Tanner , Fred Kong , Herbert Harrison
- 申请人: Li Wang , Sima Dimitrijev , Alan Iacopi , Jisheng Han , Leonie Hold , Philip Tanner , Fred Kong , Herbert Harrison
- 申请人地址: AU East Melbourne
- 专利权人: Qs Semiconductor Australia Pty Ltd
- 当前专利权人: Qs Semiconductor Australia Pty Ltd
- 当前专利权人地址: AU East Melbourne
- 主分类号: H01L29/24
- IPC分类号: H01L29/24 ; C30B23/00
摘要:
Embodiments of the invention relate generally to semiconductors and semiconductor fabrication techniques, and more particularly, to devices, integrated circuits, substrates, and methods to form silicon carbide structures, including epitaxial layers, by supplying sources of silicon and carbon with sequential emphasis. In at least some embodiments, a method of forming an epitaxial layer of silicon carbide can include depositing a layer on a substrate in the presence of a silicon source, and purging gaseous materials subsequent to depositing the layer. Further, the method can include converting the layer into a sub-layer of silicon carbide in the presence of a carbon source, and purging other gaseous materials subsequent to converting the layer. The presence of the silicon source can be independent of the presence of the carbon source. In some embodiments, dopants, such as n-type dopants, can be introduced during the formation of the epitaxial layer of silicon carbide.
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