Invention Application
- Patent Title: METHOD FOR SAMPLING DATA AND APPARATUS THEREFOR
- Patent Title (中): 采样数据及其设备的方法
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Application No.: US12988831Application Date: 2008-05-19
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Publication No.: US20110043253A1Publication Date: 2011-02-24
- Inventor: Conor O'Keeffe , Kiyoshi Kase , Paul Kelleher
- Applicant: Conor O'Keeffe , Kiyoshi Kase , Paul Kelleher
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- International Application: PCT/IB08/51950 WO 20080519
- Main IPC: H03D13/00
- IPC: H03D13/00

Abstract:
A semiconductor device comprises sampling logic, comprising: input sample path selection logic arranged to enable at least one input sample path; sampler logic arranged to receive and sample an input data signal in a serial data stream in accordance with a phase of the at least one enabled input sample path; and transition detection logic arranged to detect transitions within the received input data signal. The input sample path selection logic is further arranged, upon detection of a transition within the received input data signal, to determine if the phase of the at least one input sample path is a phase having a largest window between logic values; and if it is determined that the phase of the at least one input sample path is not the phase having a largest window between logic values, to enable at least one input sample path comprising a more appropriate phase.
Public/Granted literature
- US08923465B2 Method for sampling data and apparatus therefor Public/Granted day:2014-12-30
Information query
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