发明申请
- 专利标题: Control System and Semiconductor Device Used Therein
- 专利标题(中): 其中使用的控制系统和半导体装置
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申请号: US12855428申请日: 2010-08-12
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公开(公告)号: US20110049988A1公开(公告)日: 2011-03-03
- 发明人: Nobuyasu KANEKAWA , Teppei HIROTSU , Itaru TANABE , Shuichi MIYAOKA , Ryoichi OURA
- 申请人: Nobuyasu KANEKAWA , Teppei HIROTSU , Itaru TANABE , Shuichi MIYAOKA , Ryoichi OURA
- 申请人地址: JP Hitachinaka-shi
- 专利权人: Hitachi Automotive Systems, Ltd.
- 当前专利权人: Hitachi Automotive Systems, Ltd.
- 当前专利权人地址: JP Hitachinaka-shi
- 优先权: JP2009-200462 20090831; JP2010-123792 20100531
- 主分类号: H02J4/00
- IPC分类号: H02J4/00
摘要:
The present invention aims to provide a control system which is capable of building high-precision current detecting means in a single-chip LSI and can be realized at a lower cost, and a semiconductor device used in the control system. Drive circuits are provided inside the same semiconductor chip. The drive circuits are equipped with: current detecting shunt resistors each of which is provided in each of the drive circuits and detects a current flowing through a load, the current detecting shunt resistors being provided within a semiconductor chip by the same process; a dummy resistor provided within the semiconductor chip by the same process as the current detecting shunt resistors; and a calibration reference externally attached to the semiconductor chip and connected to the dummy resistor. A correcting means corrects the values of currents that flow through the current detecting shunt resistors, using the dummy resistor and the calibration reference.