Invention Application
- Patent Title: APPARATUS AND METHOD FOR MEASURING A THREE-DIMENSIONAL SHAPE
- Patent Title (中): 用于测量三维形状的装置和方法
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Application No.: US12919691Application Date: 2009-02-25
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Publication No.: US20110050893A1Publication Date: 2011-03-03
- Inventor: Seung-Jun Lee , Kwang-Ill Kho , Moon-Young Jeon , Sang-Kyu Yun , Hong-Min Kim , Jung Hur
- Applicant: Seung-Jun Lee , Kwang-Ill Kho , Moon-Young Jeon , Sang-Kyu Yun , Hong-Min Kim , Jung Hur
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Priority: KR10-2008-0017439 20080226; KR10-2008-0082629 20080823; KR10-2009-0015691 20090225
- International Application: PCT/KR09/00904 WO 20090225
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.
Public/Granted literature
- US08854610B2 Apparatus and method for measuring a three-dimensional shape Public/Granted day:2014-10-07
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