Invention Application
- Patent Title: 3D IMAGE MEASURING APPARATUS AND METHOD THEREOF
- Patent Title (中): 3D图像测量装置及其方法
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Application No.: US12878866Application Date: 2010-09-09
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Publication No.: US20110058181A1Publication Date: 2011-03-10
- Inventor: Kwang-Ill KOH , Eun-Hyoung SEONG , Moon-Young JEON , Min-Young KIM , Seung-Jun LEE
- Applicant: Kwang-Ill KOH , Eun-Hyoung SEONG , Moon-Young JEON , Min-Young KIM , Seung-Jun LEE
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Priority: KR10-2005-123409 20051214; KR10-2005-123412 20051214
- Main IPC: G01B11/24
- IPC: G01B11/24
Abstract:
A 3D measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which control the first and the second lattice simultaneously with predetermined n times.
Public/Granted literature
- US08319977B2 3D image measuring apparatus and method thereof Public/Granted day:2012-11-27
Information query
