发明申请
- 专利标题: Method for Stacked Contact with Low Aspect Ratio
- 专利标题(中): 堆叠接触方式与低纵横比
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申请号: US12973707申请日: 2010-12-20
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公开(公告)号: US20110092019A1公开(公告)日: 2011-04-21
- 发明人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 申请人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L21/60
- IPC分类号: H01L21/60
摘要:
A method for an integrated circuit structure includes providing a semiconductor substrate; forming a metallization layer over the semiconductor substrate; forming a first dielectric layer between the semiconductor substrate and the metallization layer; forming a second dielectric layer between the semiconductor substrate and the metallization layer, wherein the second dielectric layer is over the first dielectric layer; and forming a contact plug with an upper portion substantially in the second dielectric layer and a lower portion substantially in the first dielectric layer. The contact plug is electrically connected to a metal line in the metallization layer. The contact plug is discontinuous at an interface between the upper portion and the lower portion.
公开/授权文献
- US08450200B2 Method for stacked contact with low aspect ratio 公开/授权日:2013-05-28
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