Invention Application
- Patent Title: SYSTEMS AND METHODS FOR DISTORTION MEASUREMENT USING DISTORTION-TO-AMPLITUDE TRANSFORMATIONS
- Patent Title (中): 使用失真到幅度变换的失真测量的系统和方法
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Application No.: US12917386Application Date: 2010-11-01
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Publication No.: US20110102080A1Publication Date: 2011-05-05
- Inventor: Abhijit Chatterjee , Shreyas Sen , Shyam Kumar Devarakond
- Applicant: Abhijit Chatterjee , Shreyas Sen , Shyam Kumar Devarakond
- Applicant Address: US GA Atlanta
- Assignee: Georgia Tech Research Corporation
- Current Assignee: Georgia Tech Research Corporation
- Current Assignee Address: US GA Atlanta
- Main IPC: H03F1/26
- IPC: H03F1/26

Abstract:
The presently invention is directed to ways to measure distortion effects while allowing for the possibility of significant reduction in test cost. An exemplary embodiment of the present invention provides a method for amplifier distortion measurement including comparing a first amplitude response of an output signal from a power amplifier to a second amplitude response of a reference input signal to determine a set of Amplitude-to-Amplitude (“AM-AM”) distortion values. Additionally, the method for amplifier distortion measurement includes equalizing the first amplitude response of the output signal to match the second amplitude response of the reference input signal based on the set of AM-AM distortion values and creating a difference signal based on a comparison of the equalized output signal to the reference input signal. Furthermore, the method for amplifier distortion measurement includes calculating a set of Amplitude-to-Phase (“AM-PM”) distortion values based on a third amplitude response of the difference signal.
Public/Granted literature
- US08358169B2 Systems and methods for distortion measurement using distortion-to-amplitude transformations Public/Granted day:2013-01-22
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