发明申请
- 专利标题: Method for the Selective Doping of Silicon and Silicon Substrate Treated Therewith
- 专利标题(中): 用于处理硅和硅衬底的选择性掺杂的方法
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申请号: US12903804申请日: 2010-10-13
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公开(公告)号: US20110114168A1公开(公告)日: 2011-05-19
- 发明人: Dirk Habermann
- 申请人: Dirk Habermann
- 申请人地址: DE Freudenstadt
- 专利权人: Gebr. Schmid GmbH & Co.
- 当前专利权人: Gebr. Schmid GmbH & Co.
- 当前专利权人地址: DE Freudenstadt
- 优先权: DE102008019402.6 20080414
- 主分类号: H01L31/0224
- IPC分类号: H01L31/0224 ; H01L31/0216
摘要:
A method for the selective doping of silicon of a silicon substrate (1) for producing a pn-junction in the silicon is characterized by the following steps: a) Providing the surface of the silicon substrate (1) with a doping agent (2) based on phosphorous, b) heating the silicon substrate (1) for creating a phosphorous silicate glass (2) on the surface of the silicon, wherein phosphorous diffuses into the silicon as a first doping (3), c) applying a mask (4) on the phosphorous silicate glass (2), covering the regions (5) that are later highly doped, d) removing the phosphorous silicate glass (2) in the non-masked regions, e) removing the mask (4) from the phosphorous silicate glass (2), f) again heating for the further diffusion of phosphorous from the phosphorous silicate glass (2) into the silicon as a second doping for creating the highly doped regions (5), g); complete removal of the phosphorous silicate glass (2) from the silicon.
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