发明申请
US20110117747A1 METHOD OF FABRICATING SINGLE CHIP FOR INTEGRATING FIELD-EFFECT TRANSISTOR INTO MEMS STRUCTURE
审中-公开
将场效应晶体管整合到MEMS结构中的制造单芯片的方法
- 专利标题: METHOD OF FABRICATING SINGLE CHIP FOR INTEGRATING FIELD-EFFECT TRANSISTOR INTO MEMS STRUCTURE
- 专利标题(中): 将场效应晶体管整合到MEMS结构中的制造单芯片的方法
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申请号: US12652068申请日: 2010-01-05
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公开(公告)号: US20110117747A1公开(公告)日: 2011-05-19
- 发明人: Chin-Long Wey , Chin-Fong Chiu , Ying-Zong Juang , Hann-Huei Tsai , Sheng-Hsiang Tseng , Hsin-Hao Liao
- 申请人: Chin-Long Wey , Chin-Fong Chiu , Ying-Zong Juang , Hann-Huei Tsai , Sheng-Hsiang Tseng , Hsin-Hao Liao
- 申请人地址: TW Hsinchu City
- 专利权人: National Chip Implementation Center National Applied Research Laboratories
- 当前专利权人: National Chip Implementation Center National Applied Research Laboratories
- 当前专利权人地址: TW Hsinchu City
- 优先权: TW098139061 20091118
- 主分类号: H01L21/3065
- IPC分类号: H01L21/3065
摘要:
A method of fabricating a single chip for integrating a field-effect transistor into a microelectromechanical systems (MEMS) structure is provided. The method includes the steps of: providing a substrate having thereon at least one transistor structure, a MEMS structure and a blocking structure, wherein the blocking structure encircles the MEMS structure to separate the MEMS structure from the transistor structure; forming a masking layer for covering the transistor structure, the MEMS structure and the blocking structure; forming a patterned photoresist layer on the masking layer; performing a first etching process by using the patterned photoresist layer to remove the masking layer on the MEMS structure; and performing a second etching process by removing a portion of the MEMS structure to form a plurality of microstructures such that a relative motion among the microstructures takes place in a direction perpendicular to the substrate.
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