发明申请
- 专利标题： TEST ELEMENT CODING APPARATUSES, SYSTEMS AND METHODS
- 专利标题（中）： 测试元件编码设备，系统和方法
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申请号： US12944390申请日： 2010-11-11
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公开(公告)号： US20110132778A1公开(公告)日： 2011-06-09
- 发明人: John T. Austera , Abner D. Joseph , Randall Riggles , Herbert Harttig , Hans List , Bernd Roesicke , Gerrit Kocherscheidt , Bruno Thoes , Jean-Michel Asfour
- 申请人： John T. Austera , Abner D. Joseph , Randall Riggles , Herbert Harttig , Hans List , Bernd Roesicke , Gerrit Kocherscheidt , Bruno Thoes , Jean-Michel Asfour
- 优先权： EP0600380.9 20060225; EPPCT/EP2007/001605 20070223
- 主分类号： G01N27/30
- IPC分类号： G01N27/30 ; G06K19/06 ; G06K7/10 ; G01N33/50
摘要：
Certain exemplary embodiments include a test element operable to receive a sample and to provide an indication of an analyte of the sample to a meter. In one form test element comprises a substrate and an optically readable pattern provided on the substrate which encodes information relating to the test element.
公开/授权文献
- US08789756B2 Test element coding apparatuses, systems and methods 公开/授权日：2014-07-29
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