Invention Application
- Patent Title: PHOTO DETECTOR AND METHOD OF MANUFACTURING THE SAME
- Patent Title (中): 相片检测器及其制造方法
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Application No.: US12765705Application Date: 2010-04-22
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Publication No.: US20110133187A1Publication Date: 2011-06-09
- Inventor: Sang Hoon KIM , Gyungock Kim , In Gyoo Kim , Dongwoo Suh , Jiho Joo , Ki Seok Jang
- Applicant: Sang Hoon KIM , Gyungock Kim , In Gyoo Kim , Dongwoo Suh , Jiho Joo , Ki Seok Jang
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Priority: KR10-2009-0119308 20091203
- Main IPC: H01L31/0256
- IPC: H01L31/0256 ; H01L31/18 ; H01L31/0232

Abstract:
Provided is a manufacturing method of a photo detector. The method includes: forming a first single crystal semiconductor layer and an optical waveguide protruding from the first single crystal semiconductor layer; forming an insulation layer on the first single crystal semiconductor layer to cover the optical waveguide; forming an opening by etching the insulation layer to expose the top surface of the optical waveguide; forming a second single crystal semiconductor layer from the top surface of the exposed optical waveguide, in the opening; and selectively forming a poly semiconductor layer from the top surface of the second single crystal semiconductor layer, the poly semiconductor layer being doped with dopants.
Information query
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