发明申请
US20110135843A1 Deposited Film Forming Device and Deposited Film Forming Method
审中-公开
沉积成膜装置和沉积膜成型方法
- 专利标题: Deposited Film Forming Device and Deposited Film Forming Method
- 专利标题(中): 沉积成膜装置和沉积膜成型方法
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申请号: US13056112申请日: 2009-07-29
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公开(公告)号: US20110135843A1公开(公告)日: 2011-06-09
- 发明人: Koichiro Niira , Norikazu Ito , Sinichiro Inaba , Hiroshi Matsui
- 申请人: Koichiro Niira , Norikazu Ito , Sinichiro Inaba , Hiroshi Matsui
- 申请人地址: JP Kyoto-shi, Kyoto
- 专利权人: KYOCERA CORPORATION
- 当前专利权人: KYOCERA CORPORATION
- 当前专利权人地址: JP Kyoto-shi, Kyoto
- 优先权: JP2008-195813 20080730; JP2008-300643 20081126; JP2009-056541 20090310
- 国际申请: PCT/JP2009/063488 WO 20090729
- 主分类号: C23C16/50
- IPC分类号: C23C16/50 ; C23C16/455
摘要:
In order to form a high-quality Si-based film at high speed, for example, a deposited film forming device according to one aspect of the present invention includes: a chamber; a first electrode arranged in the chamber; and a second electrode arranged in the chamber and spaced a certain distance from the first electrode. The second electrode includes first and second supplying parts. The first supplying part supplies a first material gas and generates hollow cathode discharge. The second supplying part supplies a second material gas higher in decomposition rate than the first material gas.
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