Invention Application
US20110137604A1 REAL-TIME ADAPTIVE HYBRID BiST SOLUTION FOR LOW-COST AND LOW-RESOURCE ATE PRODUCTION TESTING OF ANALOG-TO-DIGITAL CONVERTERS
失效
实时自适应混合BiST解决方案，用于模拟数字转换器的低成本和低资源优化生产测试
- Patent Title: REAL-TIME ADAPTIVE HYBRID BiST SOLUTION FOR LOW-COST AND LOW-RESOURCE ATE PRODUCTION TESTING OF ANALOG-TO-DIGITAL CONVERTERS
- Patent Title (中): 实时自适应混合BiST解决方案，用于模拟数字转换器的低成本和低资源优化生产测试
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Application No.: US12957277Application Date: 2010-11-30
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Publication No.: US20110137604A1Publication Date: 2011-06-09
- Inventor: Sachin D. Dasnurkar
- Applicant: Sachin D. Dasnurkar
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Main IPC: H03M1/10
- IPC: H03M1/10 ; G06F19/00
Abstract:
An integrated circuit configured to perform hybrid built in self test (BiST) of analog-to-digital converters (ADCs) is described. The integrated circuit includes an ADC. The integrated circuit also includes a BiST controller that controls the hybrid BiST. The integrated circuit further includes a ramp generator that provides a voltage ramp to the ADC. The integrated circuit also includes a first multiplexer that switches an input for the ADC between the voltage ramp and a voltage reference signal. The integrated circuit further includes feedback circuitry for the ramp generator that maintains a constant ramp slope for the ramp generator. The integrated circuit also includes an interval counter that provides a timing reference.
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