公开(公告)号：US08283933B2

公开(公告)日：2012-10-09

申请号：US12707534

申请日：2010-02-17

Applicant: Sachin D Dasnurkar

Inventor： Sachin D Dasnurkar

IPC: G01R29/26

CPC classification number: G01R29/26 ,  G01R31/31709 ,  H04L1/205

Abstract: An apparatus configured for built in self test (BIST) jitter measurement is described. The apparatus includes a time-to-voltage converter. The time-to-voltage converter generates a voltage signal proportional to timing jitter present in a clock/data signal input. The apparatus also includes feedback circuitry for the time-to-voltage converter. The feedback circuitry provides a ramp slope for the time-to-voltage converter. The apparatus further includes a calibration controller. The calibration controller provides control signals to the time-to-voltage converter for process-independent calibration. The apparatus also includes a sample-and-hold (S/H) circuit. The S/H circuit provides a set bias voltage to the time-to-voltage converter once calibration is complete.

Abstract translation: 描述了内置自测（BIST）抖动测量的装置。 该装置包括时间 - 电压转换器。 时间到电压转换器产生与时钟/数据信号输入中存在的定时抖动成比例的电压信号。 该装置还包括用于时间 - 电压转换器的反馈电路。 反馈电路为时间到电压转换器提供斜坡斜率。 该装置还包括校准控制器。 校准控制器为时间到电压转换器提供控制信号，用于与过程无关的校准。 该装置还包括采样保持（S / H）电路。 校准完成后，S / H电路为时间到电压转换器提供设定的偏置电压。

公开(公告)号：US08310385B2

公开(公告)日：2012-11-13

申请号：US12777091

申请日：2010-05-10

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: H03M1/10

CPC classification number: H03M1/1095 ,  H03M1/12

Abstract: A method for providing built-in self test (BiST) for an analog-to-digital converter (ADC) by automatic test equipment (ATE) is described. Output codes are received from the ADC. The output codes are translated to generate a functional pattern. Performance metrics are determined for the ADC using the functional pattern. The ADC may be on a device-under-test (DUT).

Abstract translation: 描述了通过自动测试设备（ATE）为模数转换器（ADC）提供内置自检（BiST）的方法。 从ADC接收输出代码。 转换输出代码以生成功能模式。 使用功能模式为ADC确定性能指标。 ADC可能在被测器件（DUT）上。

公开(公告)号：US20100293426A1

公开(公告)日：2010-11-18

申请号：US12762985

申请日：2010-04-19

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: G01R31/3177 ,  G06F11/25

CPC classification number: G01R31/31709

Abstract: An apparatus configured for a phase locked loop (PLL) built in self test (BIST) jitter measurement is described. The apparatus includes a phase detector. The phase detector produces a digital signal that describes a comparison between a reference signal and a feedback signal. The apparatus also includes a BIST controller. The BIST controller accumulates the digital signal with successive digital signals. The apparatus also includes a communication pin. The communication pin sends the accumulated signal to automatic test equipment (ATE) that determines whether the PLL is operating correctly based on the accumulated signal.

Abstract translation: 描述了一种配置用于内置自测（BIST）抖动测量的锁相环（PLL）的装置。 该装置包括相位检测器。 相位检测器产生描述参考信号和反馈信号之间的比较的数字信号。 该装置还包括BIST控制器。 BIST控制器用连续的数字信号累加数字信号。 该装置还包括通信引脚。 通信引脚将累积信号发送到自动测试设备（ATE），根据累加信号确定PLL是否正常工作。

公开(公告)号：US20100253559A1

公开(公告)日：2010-10-07

申请号：US12697435

申请日：2010-02-01

Applicant: Sachin D Dasnurkar

Inventor： Sachin D Dasnurkar

IPC: H03M1/10

CPC classification number: H03K4/501 ,  H03K4/90 ,  H03M1/109 ,  H03M1/12

Abstract: An apparatus configured for built in self test (BiST) of analog-to-digital convertors (ADCs) is described. The apparatus includes an ADC to be tested. The apparatus includes a ramp generator. The ramp generator provides a voltage ramp to the ADC. The apparatus further includes feedback circuitry for the ramp generator. The feedback circuitry maintains a constant ramp slope for the ramp generator. The apparatus includes an interval counter. The interval counter provides a timing reference.

Abstract translation: 描述了配置用于模数转换器（ADC）的内置自检（BiST）的装置。 该装置包括要测试的ADC。 该装置包括斜坡发生器。 斜坡发生器为ADC提供电压斜坡。 该装置还包括用于斜坡发生器的反馈电路。 反馈电路为斜坡发生器保持恒定的斜坡斜率。 该装置包括间隔计数器。 间隔计数器提供定时参考。

公开(公告)号：US08510073B2

公开(公告)日：2013-08-13

申请号：US12957277

申请日：2010-11-30

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: H03M1/10

CPC classification number: H03M1/109 ,  H03M1/12

Abstract: An integrated circuit configured to perform hybrid built in self test (BiST) of analog-to-digital converters (ADCs) is described. The integrated circuit includes an ADC. The integrated circuit also includes a BiST controller that controls the hybrid BiST. The integrated circuit further includes a ramp generator that provides a voltage ramp to the ADC. The integrated circuit also includes a first multiplexer that switches an input for the ADC between the voltage ramp and a voltage reference signal. The integrated circuit further includes feedback circuitry for the ramp generator that maintains a constant ramp slope for the ramp generator. The integrated circuit also includes an interval counter that provides a timing reference.

Abstract translation: 描述了被配置为执行模数转换器（ADC）的混合内置自测（BiST）的集成电路。 集成电路包括一个ADC。 集成电路还包括控制混合BiST的BiST控制器。 集成电路还包括向ADC提供电压斜坡的斜坡发生器。 集成电路还包括第一多路复用器，其在电压斜坡和电压参考信号之间切换ADC的输入。 集成电路还包括用于斜坡发生器的反馈电路，其为斜坡发生器保持恒定的斜坡斜率。 集成电路还包括提供定时参考的间隔计数器。

公开(公告)号：US08106801B2

公开(公告)日：2012-01-31

申请号：US12697435

申请日：2010-02-01

Applicant: Sachin D Dasnurkar

Inventor： Sachin D Dasnurkar

IPC: H03M1/10

CPC classification number: H03K4/501 ,  H03K4/90 ,  H03M1/109 ,  H03M1/12

Abstract: An apparatus configured for built in self test (BiST) of analog-to-digital convertors (ADCs) is described. The apparatus includes an ADC to be tested. The apparatus includes a ramp generator. The ramp generator provides a voltage ramp to the ADC. The apparatus further includes feedback circuitry for the ramp generator. The feedback circuitry maintains a constant ramp slope for the ramp generator. The apparatus includes an interval counter. The interval counter provides a timing reference.

Abstract translation: 描述了配置用于模数转换器（ADC）的内置自检（BiST）的装置。 该装置包括要测试的ADC。 该装置包括斜坡发生器。 斜坡发生器为ADC提供电压斜坡。 该装置还包括用于斜坡发生器的反馈电路。 反馈电路为斜坡发生器保持恒定的斜坡斜率。 该装置包括间隔计数器。 间隔计数器提供定时参考。

公开(公告)号：US20110137604A1

公开(公告)日：2011-06-09

申请号：US12957277

申请日：2010-11-30

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: H03M1/10 ,  G06F19/00

CPC classification number: H03M1/109 ,  H03M1/12

Abstract: An integrated circuit configured to perform hybrid built in self test (BiST) of analog-to-digital converters (ADCs) is described. The integrated circuit includes an ADC. The integrated circuit also includes a BiST controller that controls the hybrid BiST. The integrated circuit further includes a ramp generator that provides a voltage ramp to the ADC. The integrated circuit also includes a first multiplexer that switches an input for the ADC between the voltage ramp and a voltage reference signal. The integrated circuit further includes feedback circuitry for the ramp generator that maintains a constant ramp slope for the ramp generator. The integrated circuit also includes an interval counter that provides a timing reference.

Abstract translation: 描述了被配置为执行模数转换器（ADC）的混合内置自测（BiST）的集成电路。 集成电路包括一个ADC。 集成电路还包括控制混合BiST的BiST控制器。 集成电路还包括向ADC提供电压斜坡的斜坡发生器。 集成电路还包括第一多路复用器，其在电压斜坡和电压参考信号之间切换ADC的输入。 集成电路还包括用于斜坡发生器的反馈电路，其为斜坡发生器保持恒定的斜坡斜率。 集成电路还包括提供定时参考的间隔计数器。

公开(公告)号：US20100289679A1

公开(公告)日：2010-11-18

申请号：US12777091

申请日：2010-05-10

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: H03M1/10

CPC classification number: H03M1/1095 ,  H03M1/12

Abstract: A method for providing built-in self test (BiST) for an analog-to-digital converter (ADC) by automatic test equipment (ATE) is described. Output codes are received from the ADC. The output codes are translated to generate a functional pattern. Performance metrics are determined for the ADC using the functional pattern. The ADC may be on a device-under-test (DUT).

Abstract translation: 描述了通过自动测试设备（ATE）为模数转换器（ADC）提供内置自检（BiST）的方法。 从ADC接收输出代码。 转换输出代码以生成功能模式。 使用功能模式为ADC确定性能指标。 ADC可能在被测器件（DUT）上。

公开(公告)号：US20100231233A1

公开(公告)日：2010-09-16

申请号：US12707534

申请日：2010-02-17

Applicant: Sachin D. Dasnurkar

Inventor： Sachin D. Dasnurkar

IPC: G01R29/26

CPC classification number: G01R29/26 ,  G01R31/31709 ,  H04L1/205

Abstract: An apparatus configured for built in self test (BIST) jitter measurement is described. The apparatus includes a time-to-voltage converter. The time-to-voltage converter generates a voltage signal proportional to timing jitter present in a clock/data signal input. The apparatus also includes feedback circuitry for the time-to-voltage converter. The feedback circuitry provides a ramp slope for the time-to-voltage converter. The apparatus further includes a calibration controller. The calibration controller provides control signals to the time-to-voltage converter for process-independent calibration. The apparatus also includes a sample-and-hold (S/H) circuit. The S/H circuit provides a set bias voltage to the time-to-voltage converter once calibration is complete.

Abstract translation: 描述了内置自测（BIST）抖动测量的装置。 该装置包括时间 - 电压转换器。 时间到电压转换器产生与时钟/数据信号输入中存在的定时抖动成比例的电压信号。 该装置还包括用于时间 - 电压转换器的反馈电路。 反馈电路为时间到电压转换器提供斜坡斜率。 该装置还包括校准控制器。 校准控制器为时间到电压转换器提供控制信号，用于与过程无关的校准。 该装置还包括采样保持（S / H）电路。 校准完成后，S / H电路为时间到电压转换器提供设定的偏置电压。