发明申请
- 专利标题: METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE
- 专利标题(中): 制造半导体器件的方法
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申请号: US12961410申请日: 2010-12-06
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公开(公告)号: US20110151649A1公开(公告)日: 2011-06-23
- 发明人: James A. Cooper , Xiaokun Wang
- 申请人: James A. Cooper , Xiaokun Wang
- 申请人地址: US IN West Lafayette
- 专利权人: PURDUE RESEARCH FOUNDATION
- 当前专利权人: PURDUE RESEARCH FOUNDATION
- 当前专利权人地址: US IN West Lafayette
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
A method for fabricating a semiconductor device includes forming a first semiconductor layer on a front side of the semiconductor substrate. Additional semiconductor layers may be formed on a font side of the first semiconductor layer. The substrate is subsequently removed. In some embodiments, one or more additional semiconductor layers may be formed on the back side of the first semiconductor layer after the semiconductor substrate has been removed. Additionally, in some embodiments, a portion of the first semiconductor layer is removed along with the semiconductor substrate. In such embodiments, the first semiconductor layer is subsequently etched to a known thickness. Source regions and device electrodes may be then be formed.
公开/授权文献
- US08343841B2 Method for fabricating a semiconductor device 公开/授权日:2013-01-01
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