Invention Application
- Patent Title: TIME-TO-DIGITAL CONVERTER WITH BUILT-IN SELF TEST
- Patent Title (中): 具有内置自检功能的时间到数字转换器
-
Application No.: US12684771Application Date: 2010-01-08
-
Publication No.: US20110169673A1Publication Date: 2011-07-14
- Inventor: Stephan Henzler
- Applicant: Stephan Henzler
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies
- Current Assignee: Infineon Technologies
- Current Assignee Address: DE Neubiberg
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
Apparatuses and methods related to time-to-digital converters (TDCs) are herein described. Generally, a time-to-digital converter is a device which measures a time period or time interval and outputs a digital value representing the measured time period. In an implementation, an apparatus is provided comprising a time-to-digital converter circuit, which further comprises a built-in self test (BIST). The built-in self test may be implemented using one or more oscillators coupled to the time-to-digital converter via one or more multiplexer devices.
Public/Granted literature
- US08072361B2 Time-to-digital converter with built-in self test Public/Granted day:2011-12-06
Information query