Invention Application
US20110169673A1 TIME-TO-DIGITAL CONVERTER WITH BUILT-IN SELF TEST 有权
具有内置自检功能的时间到数字转换器

  • Patent Title: TIME-TO-DIGITAL CONVERTER WITH BUILT-IN SELF TEST
  • Patent Title (中): 具有内置自检功能的时间到数字转换器
  • Application No.: US12684771
    Application Date: 2010-01-08
  • Publication No.: US20110169673A1
    Publication Date: 2011-07-14
  • Inventor: Stephan Henzler
  • Applicant: Stephan Henzler
  • Applicant Address: DE Neubiberg
  • Assignee: Infineon Technologies
  • Current Assignee: Infineon Technologies
  • Current Assignee Address: DE Neubiberg
  • Main IPC: H03M1/00
  • IPC: H03M1/00
TIME-TO-DIGITAL CONVERTER WITH BUILT-IN SELF TEST
Abstract:
Apparatuses and methods related to time-to-digital converters (TDCs) are herein described. Generally, a time-to-digital converter is a device which measures a time period or time interval and outputs a digital value representing the measured time period. In an implementation, an apparatus is provided comprising a time-to-digital converter circuit, which further comprises a built-in self test (BIST). The built-in self test may be implemented using one or more oscillators coupled to the time-to-digital converter via one or more multiplexer devices.
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