Invention Application
- Patent Title: EQUIPMENT AND METHOD FOR ANALYZING IMAGE DATA
- Patent Title (中): 用于分析图像数据的设备和方法
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Application No.: US12984743Application Date: 2011-01-05
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Publication No.: US20110170783A1Publication Date: 2011-07-14
- Inventor: Yuuki ONO , Tatsuhiko SAITOU
- Applicant: Yuuki ONO , Tatsuhiko SAITOU
- Applicant Address: JP Osaka-shi
- Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- Current Assignee Address: JP Osaka-shi
- Priority: JP2010-002906 20100108
- Main IPC: G06K9/46
- IPC: G06K9/46

Abstract:
An analyzing unit has a linear SVM discriminating section and a nonlinear SVM discriminating section and analyzes an image data having an intensity data for numerous wavelengths in each pixel. In the linear SVM discriminating section, the discrimination as to whether the intensity data is an object data or not is performed for every pixel by using an intensity data of the image data as a feature quantity and using the linear SVM, and subsequently in the nonlinear SVM discriminating section, discrimination using the nonlinear SVM is performed only with respect to the pixels discriminated by the linear SVM as their intensity data being object data. Discrimination can be accomplished with higher precision as compared with the case where all pixels are discriminated only with the linear SVM. Also, as compared with the case where the discrimination is conducted only with the nonlinear SVM for all pixels, the discrimination can be accomplished at higher speed.
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