发明申请
- 专利标题： DEFECT DETECTION IN OBJECTS USING STATISTICAL APPROACHES
- 专利标题（中）： 使用统计方法对物体进行缺陷检测
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申请号： US13121092申请日： 2009-09-25
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公开(公告)号： US20110238336A1公开(公告)日： 2011-09-29
- 发明人: Francesco Lanza Di Scalea , Stefano Coccia , Ivan Bartoli , Salvatore Salamone , Piervincenzo Rizzo
- 申请人： Francesco Lanza Di Scalea , Stefano Coccia , Ivan Bartoli , Salvatore Salamone , Piervincenzo Rizzo
- 申请人地址： US CA Oakland
- 专利权人： The Regents of the University of California
- 当前专利权人： The Regents of the University of California
- 当前专利权人地址： US CA Oakland
- 国际申请： PCT/US2009/058442 WO 20090925
- 主分类号： G01N29/04
- IPC分类号： G01N29/04 ; G06F17/18
摘要：
Disclosed are systems, methods and articles, including an inspection system that includes at least one generator to apply energy to an object at an application point to cause waves to travel, at least partly, through the object. The system further includes at least one detector configured to detect at least a portion of the waves traveling through the object, and a statistical analyzer to perform a statistical analysis based on an output produced by the at least one detector in response to the detected portion of the waves, the statistical analysis being used to determine whether at least one defect is present in the object.
公开/授权文献
- US08626459B2 Defect detection in objects using statistical approaches 公开/授权日：2014-01-07