发明申请
- 专利标题: PHOTOLITHOGRAPHY METHOD AND DEVICE
- 专利标题(中): 光刻方法和装置
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申请号: US13085857申请日: 2011-04-13
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公开(公告)号: US20110255064A1公开(公告)日: 2011-10-20
- 发明人: Jerome Conraux , Christiane Fantauzzo , Patrice Hamard , Pierre Nunzi , Patrick Regnier
- 申请人: Jerome Conraux , Christiane Fantauzzo , Patrice Hamard , Pierre Nunzi , Patrick Regnier
- 申请人地址: FR Rousset
- 专利权人: STMICROELECTRONICS (ROUSSET) SAS
- 当前专利权人: STMICROELECTRONICS (ROUSSET) SAS
- 当前专利权人地址: FR Rousset
- 优先权: FR1001683 20100420
- 主分类号: G03B27/42
- IPC分类号: G03B27/42
摘要:
A photolithography method includes projecting a light beam through a mask onto a photosensitive layer to form on the photosensitive layer an image of a mask pattern formed by the mask, and controlling a layer of active elements of the mask so that the light beam after having traversed the layer of active elements, reproduces the mask pattern onto the photosensitive layer. The active elements are distributed throughout the layer of active elements in conformance with a matrical organization of lines and columns, each active element being individually controllable to take a state transparent to the light of the light beam, or else a state opaque to or reflecting of the light of the light beam, as a function of a command signal supplied to the active element.
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