发明申请
- 专利标题: Memory Cell With Resistance-Switching Layers
- 专利标题(中): 具有电阻切换层的存储单元
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申请号: US13157191申请日: 2011-06-09
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公开(公告)号: US20110310653A1公开(公告)日: 2011-12-22
- 发明人: Franz Kreupl , Xiying Costa , James Kai , Raghuveer S. Makala
- 申请人: Franz Kreupl , Xiying Costa , James Kai , Raghuveer S. Makala
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; H01L45/00
摘要:
A memory device in a 3-D read and write memory includes memory cells. Each memory cell includes a resistance-switching memory element (RSME) in series with a steering element. The RSME has first and second resistance-switching layers on either side of a conductive intermediate layer, and first and second electrodes at either end of the RSME. The first and second resistance-switching layers can both have a bipolar or unipolar switching characteristic. In a set or reset operation of the memory cell, an electric field is applied across the first and second electrodes. An ionic current flows in the resistance-switching layers, contributing to a switching mechanism. An electron flow, which does not contribute to the switching mechanism, is reduced due to scattering by the conductive intermediate layer, to avoid damage to the steering element. Particular materials and combinations of materials for the different layers of the RSME are provided.
公开/授权文献
- US08737111B2 Memory cell with resistance-switching layers 公开/授权日:2014-05-27
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