发明申请
- 专利标题: CHARACTERISTIC MEASURING DEVICE FOR SOLAR CELL
- 专利标题(中): 太阳能电池特性测量装置
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申请号: US13140979申请日: 2009-08-27
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公开(公告)号: US20110316578A1公开(公告)日: 2011-12-29
- 发明人: Yoshinori Mizutani , Taiichiro Suda
- 申请人: Yoshinori Mizutani , Taiichiro Suda
- 申请人地址: JP Tokyo
- 专利权人: TAHARA ELECTRIC CO., LTD.
- 当前专利权人: TAHARA ELECTRIC CO., LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-321920 20081218
- 国际申请: PCT/JP2009/064970 WO 20090827
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
A solar cell characteristic measuring device measures the output characteristics of a solar cell while avoiding junction capacitance. The device provides a solar cell load circuit by connecting the solar cell with an electronic load device setting a load current or voltage variably, and a measurement circuit connecting voltage and current detectors with the load. An operation point control element divides the magnitude of the load, taken from the solar cell, of the electronic load device into a plurality ranging from states of opening to short-circuiting, while driving the load device in the load circuit periodically and intermittently, changing the load magnitude stepwise and controlling the operation point of the solar cell, and a processing element reading and processing the detected values of the voltage and current detectors at each drive period of the electronic load device and for the period of the stable output voltage of the solar cell.
公开/授权文献
- US08264251B2 Characteristic measuring device for solar cell 公开/授权日:2012-09-11
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