- 专利标题: MONITORING APPARATUS FOR MONITORING AN ABLATION PROCEDURE
- 专利标题(中): 监测装置的监测程序
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申请号: US13142299申请日: 2010-01-08
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公开(公告)号: US20120004547A1公开(公告)日: 2012-01-05
- 发明人: Erik Harks , Szabolcs Deladi , Jan Frederik Suijver , Ladislav Jankovic , Yan Shi , Wouter Harry Jacinth Rensen , Maya Barley , Nijs Cornelis Van Der Vaart
- 申请人: Erik Harks , Szabolcs Deladi , Jan Frederik Suijver , Ladislav Jankovic , Yan Shi , Wouter Harry Jacinth Rensen , Maya Barley , Nijs Cornelis Van Der Vaart
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL EINDHOVEN
- 国际申请: PCT/IB2010/050059 WO 20100108
- 主分类号: A61B8/00
- IPC分类号: A61B8/00 ; A61B18/12 ; A61B8/12
摘要:
The present invention relates to a monitoring apparatus (101) for monitoring an ablation procedure. The monitoring apparatus (101) comprises an ultrasound signal providing unit for providing an ultrasound signal that depends on received echo series of an object (4) that is ablated. The monitoring apparatus (101) further comprises an ablation depth determination unit (103) for determining an ablation depth from the provided ultrasound signal. The ablation depth can be determined directly from the ultrasound signal and is an important parameter while performing an ablation procedure. For example, it can be used for determining the progress of ablation within the object (4) and for determining when the ablation has reached a desired progression.
公开/授权文献
- US09901321B2 Monitoring apparatus for monitoring an ablation procedure 公开/授权日:2018-02-27
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