Invention Application
- Patent Title: METHOD FOR CLEANING SKID OF SURFACE ROUGHNESS TESTER
- Patent Title (中): 清洁表面粗糙度试验机的方法
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Application No.: US13178792Application Date: 2011-07-08
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Publication No.: US20120017940A1Publication Date: 2012-01-26
- Inventor: Sadayuki MATSUMIYA , Nobuyuki HAMA
- Applicant: Sadayuki MATSUMIYA , Nobuyuki HAMA
- Applicant Address: JP Kawasaki-shi
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki-shi
- Priority: JP2010-162437 20100720
- Main IPC: B08B7/04
- IPC: B08B7/04

Abstract:
A method for cleaning a skid of a surface roughness tester including the skid provided with a skid aperture in a vertical direction, and a stylus disposed in the skid aperture of the skid and capable of moving in the vertical direction, wherein the surface roughness tester measures surface roughness of an object by moving the skid along a surface of the object. The method includes removing a foreign substance existing in a gap between the skid aperture and the stylus after measuring the surface roughness of the object.
Public/Granted literature
- US09103656B2 Method for cleaning skid of surface roughness tester Public/Granted day:2015-08-11
Information query
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