Invention Application
- Patent Title: METHOD AND APPARATUS FOR WAVE DETECTION
- Patent Title (中): 波形检测方法与装置
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Application No.: US13190782Application Date: 2011-07-26
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Publication No.: US20120025806A1Publication Date: 2012-02-02
- Inventor: Siew Yong CHUI , Rajesh Tiruvuru
- Applicant: Siew Yong CHUI , Rajesh Tiruvuru
- Main IPC: G01R19/00
- IPC: G01R19/00

Abstract:
Aspects of the disclosure provide method and apparatus for detecting attributes of an input power supply. The method includes receiving a first signal generated based on a second signal that is predictive. The first signal includes a portion that substantially corresponds to the second signal. Further, the method includes detecting attributes of the portion of the first signal that substantially corresponds to the second signal, and determining attributes of the second signal based on the attributes of the portion of the first signal that substantially corresponds to the second signal.
Public/Granted literature
- US08773110B2 Method and apparatus for wave detection Public/Granted day:2014-07-08
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