发明申请
- 专利标题: Inspection Apparatus and Method for Producing Image for Inspection
- 专利标题(中): 检验仪器及其检测方法
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申请号: US13160108申请日: 2011-06-14
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公开(公告)号: US20120026317A1公开(公告)日: 2012-02-02
- 发明人: Kenji NAKAHIRA , Atsushi Miyamoto , Naoki Hosoya , Minoru Yoshida
- 申请人: Kenji NAKAHIRA , Atsushi Miyamoto , Naoki Hosoya , Minoru Yoshida
- 申请人地址: JP Hitachi-shi
- 专利权人: Hitachi-GE Nuclear Energy, Ltd.
- 当前专利权人: Hitachi-GE Nuclear Energy, Ltd.
- 当前专利权人地址: JP Hitachi-shi
- 优先权: JP2010-170561 20100729; JP2011-016614 20110128
- 主分类号: H04N7/18
- IPC分类号: H04N7/18
摘要:
In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
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