发明申请
- 专利标题: METHODS OF FABRICATING SEMICONDUCTOR DEVICES HAVING VARIOUS ISOLATION REGIONS
- 专利标题(中): 制备各种分离区域的半导体器件的方法
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申请号: US13162050申请日: 2011-06-16
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公开(公告)号: US20120034757A1公开(公告)日: 2012-02-09
- 发明人: Yong-Soon Choi , Jun-Won Lee , Gil-Heyun Choi , Eunkee Hong , Hong-Gun Kim , Ha-Young Yi
- 申请人: Yong-Soon Choi , Jun-Won Lee , Gil-Heyun Choi , Eunkee Hong , Hong-Gun Kim , Ha-Young Yi
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2010-0075693 20100805
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
A method of fabricating a semiconductor device includes forming a first trench and a second trench in a semiconductor substrate, forming a first insulator to completely fill the first trench, the first insulator covering a bottom surface and lower sidewalls of the second trench and exposing upper sidewalls of the second trench, and forming a second insulator on the first insulator in the second trench.
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