Invention Application
- Patent Title: METHOD FOR PRODUCING SILICON EPITAXIAL WAFER
- Patent Title (中): 生产硅外延层的方法
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Application No.: US13264057Application Date: 2010-04-12
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Publication No.: US20120034850A1Publication Date: 2012-02-09
- Inventor: Shigeru Okuuchi , Shinichi Ogata
- Applicant: Shigeru Okuuchi , Shinichi Ogata
- Applicant Address: JP Tokyo
- Assignee: SUMCO CORPORATION
- Current Assignee: SUMCO CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2009-096800 20090413
- International Application: PCT/JP2010/056517 WO 20100412
- Main IPC: B24B1/00
- IPC: B24B1/00

Abstract:
The method for producing a silicon epitaxial wafer according to the present invention has: a growth step F at which an epitaxial layer is grown on a silicon single crystal substrate; a first polishing step D at which, before the growth step, at least a front surface of the silicon single crystal substrate is polished without using abrasive grains; and a second polishing step G at which at least the front surface of the silicon single crystal substrate is subjected to finish polishing after the growth step.
Public/Granted literature
- US08673784B2 Method for producing silicon epitaxial wafer Public/Granted day:2014-03-18
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