发明申请
- 专利标题: SEMICONDUCTOR CIRCUIT AND METHOD OF RETRIEVING SIGNAL TO SEMICONDUCTOR CIRCUIT
- 专利标题(中): 半导体电路和信号到半导体电路的检测方法
-
申请号: US13190915申请日: 2011-07-26
-
公开(公告)号: US20120038403A1公开(公告)日: 2012-02-16
- 发明人: Norihiko SATANI , Yuichi Matsushita , Takahiro Imayoshi
- 申请人: Norihiko SATANI , Yuichi Matsushita , Takahiro Imayoshi
- 优先权: JP2010-180979 20100812
- 主分类号: H03L7/00
- IPC分类号: H03L7/00
摘要:
In a semiconductor circuit, a high frequency level detecting unit detects a level of a high frequency component adjusted with a first adjusting unit, and a first control unit controls a first gain of the adjusting unit according to the level of the high frequency component thus detected. Further, a low frequency level detecting unit detects a level of a low frequency component adjusted with a second adjusting unit. A second control unit controls a second gain according to the level of the high frequency component and the level of the low frequency component thus adjusted, so that a difference between the level of the high frequency component adjusted with the first adjusting unit and the level of the low frequency component adjusted with the second adjusting unit becomes smaller than a specific level determined in advance.
公开/授权文献
信息查询