发明申请
US20120051872A1 INTEGRATED APPARATUS TO ASSURE WAFER QUALITY AND MANUFACTURABILITY 有权
整体设备,以确保质量和制造能力

INTEGRATED APPARATUS TO ASSURE WAFER QUALITY AND MANUFACTURABILITY
摘要:
The present disclosure provides a system and method for processing a semiconductor substrate wherein a substrate is received at a load lock interface. The substrate is transferred from the load lock interface to a process module using a first module configured for unprocessed substrates. A manufacturing process is performed on the substrate within the process module. Thereafter, the substrate is transferred from the process module to the load lock interface using a second module configured for processed substrates.
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