Invention Application
US20120057413A1 SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF 有权
半导体存储器及其测试方法

SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF
Abstract:
A semiconductor memory apparatus includes a clock control unit configured to receive a first clock when an enable signal is activated and generate a second clock which has a cycle closer in length to a target clock cycle than the first clock; a DLL input clock generation unit configured to output one of the first clock and the second clock as a DLL input clock according to a DLL select signal; and an address/command input clock generation unit configured to output one of the first clock and the second clock as an AC input clock according to the enable signal.
Public/Granted literature
Information query
Patent Agency Ranking
0/0