Invention Application
- Patent Title: SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF
- Patent Title (中): 半导体存储器及其测试方法
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Application No.: US12948874Application Date: 2010-11-18
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Publication No.: US20120057413A1Publication Date: 2012-03-08
- Inventor: Tae Sik YUN , Hyung Dong Lee , Jun Gi Choi , Sang Jin Byeon , Sang Hoon Shin
- Applicant: Tae Sik YUN , Hyung Dong Lee , Jun Gi Choi , Sang Jin Byeon , Sang Hoon Shin
- Applicant Address: KR Ichon-shi
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Ichon-shi
- Priority: KR10-2010-0086491 20100903
- Main IPC: G11C8/18
- IPC: G11C8/18 ; G11C29/00 ; G11C7/10 ; G11C7/22

Abstract:
A semiconductor memory apparatus includes a clock control unit configured to receive a first clock when an enable signal is activated and generate a second clock which has a cycle closer in length to a target clock cycle than the first clock; a DLL input clock generation unit configured to output one of the first clock and the second clock as a DLL input clock according to a DLL select signal; and an address/command input clock generation unit configured to output one of the first clock and the second clock as an AC input clock according to the enable signal.
Public/Granted literature
- US08300496B2 Semiconductor memory apparatus and test method thereof Public/Granted day:2012-10-30
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