发明申请
- 专利标题： INSULATED PROBE PIN AND METHOD FOR FABRICATING THE SAME
- 专利标题（中）： 绝缘探针及其制造方法
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申请号： US13274676申请日： 2011-10-17
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公开(公告)号： US20120091999A1公开(公告)日： 2012-04-19
- 发明人: Toshihiro Zushi , Kenji Kawamura , Masayuki Ataka , Toyokazu Nagato , Hiroyuki Kamibayashi
- 申请人： Toshihiro Zushi , Kenji Kawamura , Masayuki Ataka , Toyokazu Nagato , Hiroyuki Kamibayashi
- 申请人地址： JP Tokyo
- 专利权人： MITSUBISHI CABLE INDUSTRIES, LTD.
- 当前专利权人： MITSUBISHI CABLE INDUSTRIES, LTD.
- 当前专利权人地址： JP Tokyo
- 优先权： JP2010-233920 20101018
- 主分类号： G01R1/06
- IPC分类号： G01R1/06
摘要：
An insulated probe pin 10 includes a conductor probe pin 11 and an insulator coating 12 covering a periphery of the conductor probe pin 10 such that a sensing-side end portion of the conductor probe pin 10 is exposed. An end portion 12a of the insulator coating 12 toward the sensing-side end of the conductor probe pin 11 has a thickness larger than that of an end portion of the insulator coating 12 toward a connection-side end of the conductor probe pin 11 in an entire periphery of the insulator coating 12.
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