发明申请
- 专利标题: CORRECTION METHOD FOR DIFFERENTIAL PHASE CONTRAST IMAGING
- 专利标题(中): 用于差分相位成像的校正方法
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申请号: US13319527申请日: 2010-06-10
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公开(公告)号: US20120099702A1公开(公告)日: 2012-04-26
- 发明人: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- 申请人: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP09162764.6 20090616
- 国际申请: PCT/IB2010/052577 WO 20100610
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
The present invention generally refers to a correction method for grating-based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating. This problem, which is further aggravated by noise in the obtained DPCI images, occurs if the phase between two adjacent pixels in the detected X-ray image varies by more than π radians and is effected by a line integration over the object's local phase gradient, which induces a phase offset error of π radians that leads to prominent line artifacts parallel to the direction of said line integration.
公开/授权文献
- US08855265B2 Correction method for differential phase contrast imaging 公开/授权日:2014-10-07
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