Invention Application
- Patent Title: CORRECTION METHOD FOR DIFFERENTIAL PHASE CONTRAST IMAGING
- Patent Title (中): 用于差分相位成像的校正方法
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Application No.: US13319527Application Date: 2010-06-10
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Publication No.: US20120099702A1Publication Date: 2012-04-26
- Inventor: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- Applicant: Klaus Juergen Engel , Dieter Geller , Gereon Vogtmeier
- Applicant Address: NL EINDHOVEN
- Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- Current Assignee: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- Current Assignee Address: NL EINDHOVEN
- Priority: EP09162764.6 20090616
- International Application: PCT/IB2010/052577 WO 20100610
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
The present invention generally refers to a correction method for grating-based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating. This problem, which is further aggravated by noise in the obtained DPCI images, occurs if the phase between two adjacent pixels in the detected X-ray image varies by more than π radians and is effected by a line integration over the object's local phase gradient, which induces a phase offset error of π radians that leads to prominent line artifacts parallel to the direction of said line integration.
Public/Granted literature
- US08855265B2 Correction method for differential phase contrast imaging Public/Granted day:2014-10-07
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