发明申请
- 专利标题: SOS SUBSTRATE HAVING LOW SURFACE DEFECT DENSITY
- 专利标题(中): 具有低表面缺陷密度的SOS基底
-
申请号: US13320655申请日: 2010-05-25
-
公开(公告)号: US20120119323A1公开(公告)日: 2012-05-17
- 发明人: Shoji Akiyama , Atsuo Ito , Yuji Tobisaka , Makoto Kawai
- 申请人: Shoji Akiyama , Atsuo Ito , Yuji Tobisaka , Makoto Kawai
- 申请人地址: JP Tokyo
- 专利权人: Shin-etsu Chemical Co., Ltd.
- 当前专利权人: Shin-etsu Chemical Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2009-130969 20090529
- 国际申请: PCT/JP2010/058824 WO 20100525
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L29/02
摘要:
A method of making bonded SOS substrate with a semiconductor film on or above a sapphire substrate by implanting ions from a surface of the semiconductor substrate to form an ion-implanted layer; activating at least a surface of one of the sapphire substrate and the semiconductor substrate from which the ions have been implanted; bonding the surface of the semiconductor substrate and the surface of the sapphire substrate at a temperature of from 50° C. to 350° C.; heating the bonded substrates at a maximum temperature of from 200° C. to 350° C.; and irradiating visible light from a sapphire substrate side or a semiconductor substrate side to the ion-implanted layer of the semiconductor substrate to make the interface of the ion-implanted layer brittle at a temperature of the bonded body higher than the temperature at which the surfaces were bonded, to transfer the semiconductor film to the sapphire substrate.
信息查询
IPC分类: