发明申请
US20120134224A1 VERIFYING MULTI-CYCLE SELF REFRESH OPERATION OF SEMICONDUCTOR MEMORY DEVICE AND TESTING THE SAME
有权
验证半导体存储器件的多周期自刷新操作并对其进行测试
- 专利标题: VERIFYING MULTI-CYCLE SELF REFRESH OPERATION OF SEMICONDUCTOR MEMORY DEVICE AND TESTING THE SAME
- 专利标题(中): 验证半导体存储器件的多周期自刷新操作并对其进行测试
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申请号: US13281823申请日: 2011-10-26
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公开(公告)号: US20120134224A1公开(公告)日: 2012-05-31
- 发明人: Bo-Il SHIM , Sang-Won PARK
- 申请人: Bo-Il SHIM , Sang-Won PARK
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2010-0120719 20101130
- 主分类号: G11C11/402
- IPC分类号: G11C11/402 ; G11C29/56
摘要:
A semiconductor memory device includes a memory cell array, a tag information register, a refresh control circuit and a DQ pin. The memory cell array includes multiple memory cells divided into first cells and second cells according to corresponding data retention times. The tag information register stores refresh cycle information for each wordline connected to the first cells and the second cells. The refresh control circuit is configured to generate a refresh enable signal and a refresh address based on the refresh cycle information. The DQ pin is configured to output the refresh enable signal, the refresh address and data stored in the memory cell array.
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