发明申请
US20120157006A1 APPARATUS AND METHOD FOR COMPENSATING THE AXIAL RATIO OF AN ANTENNA FOR TESTING RFID TAGS
有权
用于补偿用于测试RFID标签的天线的轴向比例的装置和方法
- 专利标题: APPARATUS AND METHOD FOR COMPENSATING THE AXIAL RATIO OF AN ANTENNA FOR TESTING RFID TAGS
- 专利标题(中): 用于补偿用于测试RFID标签的天线的轴向比例的装置和方法
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申请号: US13157325申请日: 2011-06-10
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公开(公告)号: US20120157006A1公开(公告)日: 2012-06-21
- 发明人: Min-Kao Hong , Po-Kuang Chang , Shang-Sian You
- 申请人: Min-Kao Hong , Po-Kuang Chang , Shang-Sian You
- 申请人地址: TW Hsinchu
- 专利权人: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- 当前专利权人: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- 当前专利权人地址: TW Hsinchu
- 优先权: TW99144957 20101221
- 主分类号: H04B17/00
- IPC分类号: H04B17/00
摘要:
A method for compensating the axial ratio of an antenna for testing radio-frequency identification (RFID) tags and an apparatus using the method are provided. The method includes the following steps. An initial location of the RFID tag (or a tagged product) is set to obtain an initial vector. The RFID tag and the antenna are respectively rotated with a first axis and a second axis to detect characteristics of the RFID tag in all directions, and the first axis and the second axis are perpendicular. A polarization angle of the RFID tag is calculated according to the initial vector of the RFID tag and a location of the RFID tag after rotation. A compensation value is obtained through a look up table according to the polarization angle, so as to compensate for the axial ratio of the antenna.
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