发明申请
US20120173924A1 DUAL ENDIANESS AND OTHER CONFIGURATION SAFETY IN LOCK STEP DUAL-CORE SYSTEM, AND OTHER CIRCUITS, PROCESSES AND SYSTEMS
有权
锁定步骤双核系统及其他电路，处理和系统中的双重任务和其他配置安全
- 专利标题： DUAL ENDIANESS AND OTHER CONFIGURATION SAFETY IN LOCK STEP DUAL-CORE SYSTEM, AND OTHER CIRCUITS, PROCESSES AND SYSTEMS
- 专利标题（中）： 锁定步骤双核系统及其他电路，处理和系统中的双重任务和其他配置安全
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申请号： US13330877申请日： 2011-12-20
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公开(公告)号： US20120173924A1公开(公告)日： 2012-07-05
- 发明人: Yanyang Xiao , Alexandre Pierre Palus , Karl Friedrich Greb , Kevin Patrick Lavery , Paul Krause
- 申请人： Yanyang Xiao , Alexandre Pierre Palus , Karl Friedrich Greb , Kevin Patrick Lavery , Paul Krause
- 申请人地址： US TX Dallas
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： US TX Dallas
- 主分类号： G06F11/14
- IPC分类号： G06F11/14
摘要：
An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed.
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