发明申请
- 专利标题： RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, AND METHOD FOR MANUFACTURING RADIATION IMAGING APPARATUS
- 专利标题（中）： 辐射成像装置，放射成像系统及制造辐射成像装置的方法
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申请号： US13324037申请日： 2011-12-13
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公开(公告)号： US20120181434A1公开(公告)日： 2012-07-19
- 发明人: Satoru Sawada , Masato Inoue , Shinichi Takeda , Takamasa Ishii , Taiki Takei , Masayoshi Akiyama
- 申请人： Satoru Sawada , Masato Inoue , Shinichi Takeda , Takamasa Ishii , Taiki Takei , Masayoshi Akiyama
- 申请人地址： JP Tokyo
- 专利权人： CANON KABUSHIKI KAISHA
- 当前专利权人： CANON KABUSHIKI KAISHA
- 当前专利权人地址： JP Tokyo
- 优先权： JP2011-004650 20110113
- 主分类号： G01T1/20
- IPC分类号： G01T1/20 ; B32B37/14 ; B32B37/12
摘要：
A radiation imaging apparatus includes a substrate, at least one imaging element, a scintillator, a first heat peelable adhesive member which fixes the substrate to the imaging element, and a second heat peelable adhesive member which fixes the imaging element to the scintillator. An adhesive strength of the first heat peelable member is decreased by heat. A temperature of the first heat peelable adhesive member at which the adhesive strength is decreased is substantially equal to a temperature at which second heat peelable adhesive member fixes the imaging element to the scintillator. A heat transfer quantity per unit time of the substrate is different from that of the scintillator.
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