发明申请
- 专利标题: METHOD OF DETECTING A TOPOLOGY OF A REFLECTIVE SURFACE
- 专利标题(中): 检测反射表面的方法
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申请号: US13356379申请日: 2012-01-23
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公开(公告)号: US20120182557A1公开(公告)日: 2012-07-19
- 发明人: Onur Kilic , Michel J.F. Digonnet , Gordon S. Kino , Olav Solgaard
- 申请人: Onur Kilic , Michel J.F. Digonnet , Gordon S. Kino , Olav Solgaard
- 申请人地址: US CA Palo Alto
- 专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人地址: US CA Palo Alto
- 主分类号: G01N21/55
- IPC分类号: G01N21/55
摘要:
A method detects a topology of a reflective surface. The method includes providing an optical fiber positioned such that light emitted from the optical fiber is reflected by at least a portion of the reflective surface. The optical fiber and the portion of the reflective surface form an optical resonator having an optical resonance with a resonance lineshape. The method further includes emitting light from the optical fiber while the optical fiber is at a plurality of positions along the reflective surface. The light emitted from the optical fiber irradiates a corresponding plurality of portions of the reflective surface. The method further includes measuring a change of the resonance lineshape due to the irradiation of the plurality of portions of the reflective surface.
公开/授权文献
- US08373865B2 Method of detecting a topology of a reflective surface 公开/授权日:2013-02-12