发明申请
- 专利标题: DUAL WAVEBAND TEMPERATURE DETECTOR
- 专利标题(中): 双波温度检测器
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申请号: US13351882申请日: 2012-01-17
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公开(公告)号: US20120183013A1公开(公告)日: 2012-07-19
- 发明人: Alexander Stein , Francesco Pompei
- 申请人: Alexander Stein , Francesco Pompei
- 申请人地址: US MA Watertown
- 专利权人: Exergen Corporation
- 当前专利权人: Exergen Corporation
- 当前专利权人地址: US MA Watertown
- 主分类号: G01J5/02
- IPC分类号: G01J5/02
摘要:
There are many industrial applications in which non-contact temperature sensing is useful for increasing production speed and quality, such as printing, laminating, extrusion, and metal forming. Disclosed is a non-contact temperature determining apparatus which uses two wide wavelength bands integrating sensors to determine the radiance ratio of a target and thereby determine a corresponding temperature of the target. Also disclosed is a non-contact temperature determining apparatus in which a beam splitter passes one wide wavelength band to a sensor and reflects another distinct wide wavelength band to another sensor from which temperature can be determined. A disclosed embodiment of the dual waveband temperature detector improves upon traditional and currently available ratio pyrometers by further reducing the cost of the system, making installation and use easier, and improving temperature detection for low temperature industrial applications.
公开/授权文献
- US09335219B2 Dual waveband temperature detector 公开/授权日:2016-05-10