发明申请
- 专利标题： INSULATION FAILURE INSPECTING APPARATUS, INSULATION FAILURE INSPECTING METHOD USING SAME, AND METHOD FOR MANUFACTURING ELECTROCHEMICAL CELL
- 专利标题（中）： 绝缘失效检查装置，使用其的绝缘失败检查方法和制造电化学细胞的方法
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申请号： US13498953申请日： 2010-09-29
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公开(公告)号： US20120186071A1公开(公告)日： 2012-07-26
- 发明人: Takanori Yamashita , Hirohisa Akita , Noboru Akiyama , Masataka Okushita
- 申请人： Takanori Yamashita , Hirohisa Akita , Noboru Akiyama , Masataka Okushita
- 申请人地址： JP Shinjuku-ku, Tokyo
- 专利权人： DAI NIPPON PRINTING CO., LTD.
- 当前专利权人： DAI NIPPON PRINTING CO., LTD.
- 当前专利权人地址： JP Shinjuku-ku, Tokyo
- 优先权： JP2009-228790 20090930
- 国际申请： PCT/JP2010/066918 WO 20100929
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/36 ; G01R31/12
摘要：
Disclosed is a method for manufacturing an electrochemical cell, wherein an insulation failure product can be accurately rejected, and an electrochemical cell can be used again after the insulation failure inspection. In the method for manufacturing the electrochemical cell (1), which is configured by hermetically housing an electrochemical cell main body (20) such that the leading end of a metal terminal (21) protrudes to the outside of the outer housing (10), an impulse voltage is applied between the metal terminal (21) and a metal foil layer (12), the waveform of the voltage applied to the capacitance between the metal terminal (21) and the metal foil layer (12) is measured, and the insulation failure inspection step is performed.
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