发明申请
- 专利标题: AIR-DIELECTRIC FOR SUBTRACTIVE ETCH LINE AND VIA METALLIZATION
- 专利标题(中): 空气介质用于分层蚀刻线和通过金属化
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申请号: US13013108申请日: 2011-01-25
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公开(公告)号: US20120187566A1公开(公告)日: 2012-07-26
- 发明人: David V. Horak , Elbert Huang , Charles W. Koburger, III , Shom Ponoth , Chih-Chao Yang
- 申请人: David V. Horak , Elbert Huang , Charles W. Koburger, III , Shom Ponoth , Chih-Chao Yang
- 申请人地址: US NY ARMONK
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY ARMONK
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; H01L21/768
摘要:
A method and structure is disclosed whereby multiple interconnect layers having effective air gaps positioned in regions most susceptible to capacitive coupling can be formed. The method includes providing a layer of conductive features, the layer including at least two line members disposed on a substrate and spaced from one another by less than or equal to an effective distance, and at least one such line member also having a via member extending away from the substrate, depositing a poorly conformal dielectric coating to form an air gap between such line members, and exposing a top end of the via.
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