发明申请
US20120196398A1 PHOTODIODE ARRAY, METHOD FOR MANUFACTURING PHOTODIODE ARRAY, EPITAXIAL WAFER, AND METHOD FOR MANUFACTURING EPITAXIAL WAFER
有权
光致抗体阵列,制造光电子阵列的方法,外延波形和制造外延波形的方法
- 专利标题: PHOTODIODE ARRAY, METHOD FOR MANUFACTURING PHOTODIODE ARRAY, EPITAXIAL WAFER, AND METHOD FOR MANUFACTURING EPITAXIAL WAFER
- 专利标题(中): 光致抗体阵列,制造光电子阵列的方法,外延波形和制造外延波形的方法
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申请号: US13446621申请日: 2012-04-13
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公开(公告)号: US20120196398A1公开(公告)日: 2012-08-02
- 发明人: Katsushi AKITA , Takashi ISHIZUKA , Kei FUJII , Youichi NAGAI , Hideaki NAKAHATA
- 申请人: Katsushi AKITA , Takashi ISHIZUKA , Kei FUJII , Youichi NAGAI , Hideaki NAKAHATA
- 申请人地址: JP Osaka-shi
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: JP Osaka-shi
- 优先权: JP2009-252951 20091104
- 主分类号: H01L31/18
- IPC分类号: H01L31/18
摘要:
Provided are a photodiode array and its manufacturing method, which maintain the crystalline quality of an absorption layer formed on a group III-V semiconductor substrate to obtain excellent characteristics, and which improve the crystallinity at the surface of a window layer; an epitaxial wafer used for manufacturing the photodiode array; and a method for manufacturing the epitaxial wafer. A method for manufacturing a photodiode array 1 having a plurality of absorption regions 21, includes the steps of: growing an absorption layer 7 on an n-type InP substrate 3; growing an InP window layer on the absorption layer 7; and diffusing a p-type impurity in regions, in the window layer 11, corresponding to the plurality of absorption regions 21. The window layer 11 is grown by MOVPE using only metal-organic sources, at a growth temperature equal to or lower than that of the absorption layer 7.
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