Invention Application
- Patent Title: PARTS MANIPULATION, INSPECTION, AND REPLACEMENT SYSTEM AND METHOD
- Patent Title (中): 部件操纵,检查和更换系统及方法
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Application No.: US13297227Application Date: 2011-11-15
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Publication No.: US20120205296A1Publication Date: 2012-08-16
- Inventor: Arye Malek , Joshua J. Hackney , Franz W. Ulrich
- Applicant: Arye Malek , Joshua J. Hackney , Franz W. Ulrich
- Applicant Address: US MN Apple Valley
- Assignee: Charles A. Lemaire
- Current Assignee: Charles A. Lemaire
- Current Assignee Address: US MN Apple Valley
- Main IPC: B07C5/00
- IPC: B07C5/00 ; H04N7/18

Abstract:
Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a flipper mechanism. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws, a mover, and a rotator. The flipper mechanism turns the devices over and places the devices in a second tray so that another surface of the device can be inspected. A second tray-transfer device moves the second tray from the flipper to a second inspection station. The mover of the flipper mechanism removes the tray from the first inspection surface and places a tray at the second inspection surface.
Public/Granted literature
- US08286780B2 Parts manipulation, inspection, and replacement system and method Public/Granted day:2012-10-16
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