发明申请
- 专利标题: Obtaining Debug Information from a Flash Memory Device
- 专利标题(中): 从闪存设备获取调试信息
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申请号: US13032541申请日: 2011-02-22
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公开(公告)号: US20120216079A1公开(公告)日: 2012-08-23
- 发明人: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- 申请人: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- 申请人地址: US CA Cupertino
- 专利权人: APPLE INC.
- 当前专利权人: APPLE INC.
- 当前专利权人地址: US CA Cupertino
- 主分类号: G06F11/16
- IPC分类号: G06F11/16
摘要:
This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.
公开/授权文献
- US08966319B2 Obtaining debug information from a flash memory device 公开/授权日:2015-02-24
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