发明申请
- 专利标题: Photomask Cleaning Apparatus and Methods of Cleaning a Photomask Using the Same
- 专利标题(中): 光掩模清洗装置及其使用方法
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申请号: US13238805申请日: 2011-09-21
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公开(公告)号: US20120219654A1公开(公告)日: 2012-08-30
- 发明人: Jin-Ho Kim , Yo-Han Ahn , Jeong-In Yoon , Ji-Young Kim
- 申请人: Jin-Ho Kim , Yo-Han Ahn , Jeong-In Yoon , Ji-Young Kim
- 优先权: KR10-2011-0017430 20110225
- 主分类号: B28B17/02
- IPC分类号: B28B17/02
摘要:
A photomask cleaning apparatus includes a photomask receiving stage and a laser supply unit. The photomask receiving stage is configured to receive and retain a photomask in a desired orientation. The photomask has a front face having a pellicle adhesive residue region thereon. The desired orientation is with the front face positioned to allow gravity to move particles on the front face away from the front face without interference from the front face of the photomask. The laser supply unit is configured to generate a laser beam that irradiates a target region on the front face of the photomask to remove a pellicle adhesive residue from the target region. The photomask cleaning apparatus is configured to move the target region on the front face of the photomask to irradiate the entire pellicle adhesive residue region. Methods of using the photomask cleaning apparatus are also provided.
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