发明申请
US20120273691A1 CHARGED PARTICLE SYSTEM FOR PROCESSING A TARGET SURFACE 有权
用于处理目标表面的充电颗粒系统

CHARGED PARTICLE SYSTEM FOR PROCESSING A TARGET SURFACE
摘要:
The invention relates to a charged particle system for processing a target surface with at least one charged particle beam. The system comprises an optical column with a beam generator module for generating a plurality of charged particle beams, a beam modulator module for switching on and off said plurality of beams and a beam projector module for projecting beams or subbeams on said target surface. The system further comprises a frame supporting each of said modules in a fixed position and alignment elements for aligning at least one of beams and/or subbeams with a downstream module element.
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