Invention Application
US20120273886A1 EMBEDDED SOURCE/DRAIN MOS TRANSISTOR AND METHOD FOR FORMING THE SAME
有权
嵌入式源/漏极MOS晶体管及其形成方法
- Patent Title: EMBEDDED SOURCE/DRAIN MOS TRANSISTOR AND METHOD FOR FORMING THE SAME
- Patent Title (中): 嵌入式源/漏极MOS晶体管及其形成方法
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Application No.: US13380828Application Date: 2011-08-12
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Publication No.: US20120273886A1Publication Date: 2012-11-01
- Inventor: Huicai Zhong , Chao Zhao , Qingqing Liang
- Applicant: Huicai Zhong , Chao Zhao , Qingqing Liang
- Priority: CN201110112309.6 20110429
- International Application: PCT/CN2011/078320 WO 20110812
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/336

Abstract:
An embedded source/drain MOS transistor and a formation method thereof are provided. The embedded source/drain MOS transistor comprises: a semiconductor substrate; a gate structure on the semiconductor substrate; and a source/drain stack embedded in the semiconductor substrate at both sides of the gate structure with an upper surface of the source/drain stack being exposed, wherein the source/drain stack comprises a dielectric layer and a semiconductor layer above the dielectric layer. The present invention can cut off the path for the leakage current from the source region and the drain region to the semiconductor substrate, thereby reducing the leakage current from the source region and the drain region to the semiconductor substrate.
Public/Granted literature
- US08748983B2 Embedded source/drain MOS transistor Public/Granted day:2014-06-10
Information query
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