发明申请
US20120304029A1 TAP AND LINKING MODULE FOR SCAN ACCESS OF MULTIPLE CORES WITH IEEE 1149.1 TEST ACCESS PORTS
有权
用于IEEE 1149.1测试访问端口的多个光纤扫描接入的TAP和链接模块
- 专利标题： TAP AND LINKING MODULE FOR SCAN ACCESS OF MULTIPLE CORES WITH IEEE 1149.1 TEST ACCESS PORTS
- 专利标题（中）： 用于IEEE 1149.1测试访问端口的多个光纤扫描接入的TAP和链接模块
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申请号： US13559251申请日： 2012-07-26
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公开(公告)号： US20120304029A1公开(公告)日： 2012-11-29
- 发明人: Baher S. Haroun , Lee D. Whetsel
- 申请人： Baher S. Haroun , Lee D. Whetsel
- 申请人地址： US TX Dallas
- 专利权人： TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人： TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址： US TX Dallas
- 主分类号： G01R31/3177
- IPC分类号： G01R31/3177 ; G06F11/25
摘要：
An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.