Invention Application
- Patent Title: IMPEDANCE MATCHING APPARATUS
- Patent Title (中): 阻抗匹配装置
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Application No.: US13571167Application Date: 2012-08-09
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Publication No.: US20120306367A1Publication Date: 2012-12-06
- Inventor: Jae Hyun Kim , Sang Won Lee , Yong Gwan Lee
- Applicant: Jae Hyun Kim , Sang Won Lee , Yong Gwan Lee
- Priority: KR10-2010-0016065 20100223
- Main IPC: H01J19/78
- IPC: H01J19/78

Abstract:
Provided is an impedance matching apparatus for matching impedance to a plasma load. The impedance matching apparatus includes a first frequency impedance matching circuit unit that transfers an output of a first frequency RF power source unit, operating at a first frequency, to the plasma load; and a second frequency impedance matching circuit unit that transfers an output of a second frequency RF power source unit, operating at a second frequency higher than the first frequency, to the plasma load. The first frequency impedance matching circuit unit includes a T-type matching circuit, and the second frequency impedance matching circuit unit includes a standard L-type matching circuit or Π-type matching circuit.
Public/Granted literature
- US08884520B2 Impedance matching apparatus Public/Granted day:2014-11-11
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